au.\*:("DUTTWEILER, Fred")
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A new direct detection camera system for electron microscopySHENGDONG LI; BOUWER, James; DUTTWEILER, Fred et al.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 60680O.1-60680O.10, issn 0277-786X, isbn 0-8194-6108-3, 1VolConference Paper
The Intermediate Size Direct Detection Detector for Electron MicroscopyLIANG JIN; MILAZZO, Anna-Clare; KLEINFELDER, Stuart et al.Proceedings of SPIE, the International Society for Optical Engineering. 2008, pp 65010A.1-65010A.8, issn 0277-786X, isbn 978-0-8194-6614-3Conference Paper
First use of a high sensitivity active pixel sensor array as a detector for electron microscopyXUONG, Nguyen-Huu; MILAZZO, Anna-Clare; WIEMAN, Howard et al.SPIE proceedings series. 2004, pp 242-249, isbn 0-8194-5204-1, 8 p.Conference Paper